Company
United StatesMilpitas (HQ)
Process-control company that publishes wafer inspection, review and metrology systems used to find and classify defects during chip manufacturing.
2
Technologies
1
Technology Areas
3
Applications
United States
Headquarters
Key technologies and platforms from this organization.
KLA overlay and dimensional metrology systems measure layer-to-layer alignment, critical dimensions and related pattern geometry. Distinct from defect inspection and review.
AutomotiveData CenterView Details
KLA wafer defect inspection and review systems used to find, classify and monitor particles and pattern defects. Distinct from overlay and dimensional metrology.
AutomotiveData CenterView DetailsKey focus areas and application domains for this organization.
Key themes and trends derived from the published technologies of this organization on Silicon Showcase.
2 published technologies in Test & Inspection.
Published technologies associated with Automotive and Consumer Electronics.
2 published technologies associated with Data Center.
